UnitySC, based in Montbonnot, France, is a globally recognized leader in inspection and metrology. We seamlessly integrate advanced technologies to empower customers for higher yields and faster time-to-market. Our expertise includes standardized and customized solutions tailored to various sectors, revolutionizing process control.
We pioneer cutting-edge metrology tools for Advanced Packaging, covering TSVs, High BandWidth Memory Chip stacks, Hybrid-Bonding/Wafer2Wafer, and Die2Wafer. We excel in equipment for defect inspection on unpatterned wafers, serving diverse substrates like GaN, GaAs, InP, SiC, Glass, Sapphire, Ge, and Silicon. Our comprehensive portfolio spans Metrology and Inspection equipment for diverse applications, driving yield improvements.