We revolutionize contamination control for optimized chip production yields.

UNISERS AG is an ETH Zurich spinoff, incorporated in 2019 to revolutionize contamination control for optimized chip production yields. At UNISERS we have developed a new Surface Enhanced Particle Sizing (SEPS) and Surface Enhanced Raman Spectroscopy (SERS) technology. Using an enhanced signal, we find and classify contamination on a wafer. Explorer G1, designed for use in advanced semiconductor process control, has 300mm automated particle detection down to 10nm and molecular classification on particles down to 50nm. Bringing new analytical capabilities to the industry, our mission at UNISERS is to accelerate sustainable innovation and save the industry billions of dollars every year.