Confovis, located in Jena, Thuringia, specializes in the design and manufacture of Automated Optical Inspection (AOI) and optical 3D surface metrology systems. Since 2009, we have provided customer-focused, application-specific solutions for photonics, MEMS, 3DIC, and advanced packaging.

Our WAFERinspect series uses area scanning Structured Illumination Microscopy for high-precision, non-contact 3D measurements without moving optical parts. In the same beam path, we enable image-based defect inspection with various light frequencies. This offers flexibility, stability, repeatability, and accuracy for defect detection, classification, and dimensional measurement. GUI-based AI learning enables fast defect classification and customizable inspection recipes to meet diverse manufacturing requirements