Wooptix is a semiconductor wafer metrology innovator that provides the fastest, most accurate in-line measurements with the highest lateral resolution. Through its use of wavefront phase imaging (WFPI), a proprietary technique derived from research in adaptive optics, its systems measure the shape, uniformity, nanotopography and roughness of the entire silicon wafer in a single image. It is actively deploying solutions at various customer sites across Asia, Europe and North America.

Together with their resistance to vibrations and ease of adapting to the user’s needs, they are valuable systems for measuring the wafer shape and nanotopography in a single image.