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SCREEN SPE Germany GmbH

Wafer Pattern Inspection System ZI-3600

VX Instruments GmbH

Static High Power Semiconductor Testsystem STS8760neo

MIVA Technologies GmbH

Direct Imager 3000L DI Custom

VX Instruments GmbH

Dynamic High Power Semiconductor Testsystem DTS8765neo

AMADYNE GmbH

Machine platform fab1

Festo SE & Co. KG

Electric automation

Zoller + Fröhlich GmbH

Integrated solutions

Reel Company GmbH

Capacities

TEKON Prüftechnik GmbH

TEKONect 2.0

Siroco SA

AUTOMATION, CRIMPING AND MACHINIG

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