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Thermal characterisation systems for die attach, TIMs, PCBs and epitaxial stacks

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TherMap Solutions manufactures non-contact optical thermal characterisation systems for measuring thermal conductivity and thermal boundary resistance. Our FDTR systems provide unparalelled capability to characterise multilayer structures, including buried and sandwiched layers, enabling in-situ die attach and TIM measurements for quality and process control. We also offer TDTR systems for measuring the thermal properties of thin films and interfaces in epitaxial stacks and coating.

TherMap Solutions is based in Bristol, UK and recently entered into a strategic alliance with Quantum Focus Instruments (based in Visa, US), a market leader in true temperature mapping and failure analysis equipment.

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