Polytec provides instruments and components for a variety of semiconductor measurement applications: Four-Point-Probes (sophisticated fully automated systems as well as simple manual systems), CV mapping, optical, photothermal and terahertz layer thickness measurement, UV curing systems and Software for semiconductor equipment and factory automation.

Furthermore the company provides UV-, VIS-, NIR-, Raman- and fluorescence spectroscopy, fiberoptic sensing (temperature, strain, vibration), Laser-Doppler-Vibrometry, MEMS Vibration and Motion Analysis, Wafer-level MEMS Test Solutions, Surface Profilometry and Topography Measurement.