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Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation

Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation (8 exhibitors)

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cyberTECHNOLOGIES GmbH
85386 Eching, Germany
cyberTECHNOLOGIES - leading manufacturer of high-end surface metrology systems
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E+H Metrology GmbH
76185 Karlsruhe, Germany
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Euris GmbH
80935 München, Germany
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FRT GmbH
51429 Bergisch Gladbach, Germany
FormFactor FRT Metrology manufactures high-precision surface measurement tools.
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ISRA VISION AG
64297 Darmstadt, Germany
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Malvern Panalytical B.V.
7602 EA Almelo, Netherlands
Malvern Panalytical: high-end wafer metrology systems for semiconductor QC
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Precitec Optronik GmbH
63263 Neu-Isenburg, Germany
Precitec 3D Metrology - measure more precisely with light
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sentronics metrology GmbH
68167 Mannheim, Germany
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