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TSI offers ≥10 nm particle counting to reduce product defects and pass audits.

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TSI meets the critical needs of semiconductor industries by providing complete particle contamination detection from 10 nm to 25 µm. TSI instruments provide real-time data to minimize product risk, easily pass process audits, and reduce waste in both time and materials. They are a top-choice for continuous, reliable particle counting during product manufacturing and can provide a complete contamination monitoring system to automatically exchange data that allows the processes to remain in control and pass audits. TSI is so confident in our particle counting instrument reliability that most instruments are covered by unmatched industry laser warranties—5 years for remote particle counters and 4 years for 0.1 µm particle counters. Visit tsi.com/semi

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