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Experts in optical and semiconductor measurement technology

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Polytec provides instruments and components for a variety of semiconductor measurement applications:

Four-Point-Probes (sophisticated fully automated systems as well as simple manual systems), CV mapping, SECS/GEM hardware and software, optical and photothermal layer thickness measurement, InGaAs cameras, UV curing systems, fiberoptic sensing (temperature, strain, vibration), machine vision components as cameras, lenses, illumination and software packages. Laser-Doppler-Vibrometry, MEMS Vibration and Motion Analysis, Wafer-level MEMS Test Solutions, Surface Profilometry and Topography Measurement.

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