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Nanoscale Compositional Metrology Tools for Semiconductor R&D and Production

Unternehmensprofil

CAMECA is a world leading supplier of metrology solutions for semiconductor manufacturing as well as high-performance microanalytical instrumentation for materials research.

Delivering micron to nanometer level material composition, our Secondary Ion Mass Spectrometers (SIMS) and Atom Probe Tomography (APT) instruments accelerate the development of new semiconductor devices and support high volume manufacturing. Whether measuring low-level dopant implants, nanoscale transistors, or memory devices, CAMECA has a solution tailored to address multiple needs in the early stage of innovation and as well as at manufacturing level.

Our portfolio of high productivity, high precision instruments have been adopted by leading research institutes and major semiconductor manufacturers around the world.

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